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Dk
and Df extraction spreadsheet
Updated September
1, 2010
Click
here to go to our page on permittivity
Click
here to go to our other page on measuring dielectric constant
Click
here to go to our original page on measuring dielectric constant
using group delay
Click
here to go to our page on group delay
Click
here to go to our main page on S-parameters
New for August 2010! The
spreadsheet that is referenced is now available in our download
area.
Here we will show you a method
of extracting dielectric constant and dissipation factor from transmission
line measurements, which is worthy of an IEEE paper but we'd rather
share it to a wider audience. The techniques described are unique
to this web site, so please be a sport and reference us when use
our calculations in evaluating materials. Also, bear in mind that
this type of measurement is likely to result in noisy data and questionable
accuracy, and we don't accept any responsibility for inaccuracies
or errors from following our methods. By following the example(s)
on this page you will get a good feeling for how accurate Dk and
Df measurements from transmission lines really are (typically, the
accuracy is somewhere between "sucks" and "questionable").
The only way you will ever get really accurate data is to build
up an accurate database of designs on a highly repeatable material,
and globally fit measured and modeled data. That's how we know that
crystalline gallium arsenide Dk (the ER to MMIC designers) is 12.9.
Oops, some
sites give it as 13.1! And where's the variation over frequency?
You'll find a mess of conflicting information on the loss factor
of GaAs across the worldwide web. What does this say about softboard
materials where the electrical properties are dependent on manufacturers'
process control when they are fabricating sheets by the yard at
the lowest cost from a mixture of disparate materials that depend
on temperature, humidity, aging, pressure of the process? Yikes!
Note to RFIC and MMIC designers:
when you are a printed circuit board manufacturer, "Dk"
is the common term use for relative permittivity (ER), and "Df"
is the common term for dissipation factor (tanD). These guys typically
went to the county college, so they are uncomfortable using big
words, so let's give them a break and indulge them on this page!
On this page we will show you
two simple ways (which as far as we can tell are unique to this
site) to calculate these important terms for a sample material using
measurements of transmission lines.
Transmission line measurement
In order to calculate Dk and
Df, you will need to fabricate transmission line samples (or just
one line, if you are confident you can de-embed an exact length
out of a measurement. The samples should be matched as closely as
possible to 50 ohms. The connectors or RF probe pads must be as
electrically transparent as possible, and as repeatable as possible.
The RF data must be carefully measured, as accurately as possible.
Even though the measurement technique allows you to measure the
parameters over frequency, don't get greedy and try to gather 10,000
datapoints. In the end you will have to average adjacent points
together to smooth out the "noise" generated by trying
to measure slight differences in transmission phase angles.
When you perform the measurement,
you can increase the accuracy of the data by dialing down the IF bandwidth
(on Agilent's PNA it is default to 35 kHz, we suggest 500 Hz). You
should also turn up the averaging, we suggest 16 samples averaged.
Be sure you perform the calibration with the averaging on. And consider
using smoothing, as you'll see, we use it in the spreadsheet. There's
more information on smoothing group delay measurements on this
page.
The transmission line type is
up to you. The preferred type would be stripline, as you don't need
to calculate a filling factor convert Keff to Dk. Coax is just as
good, so cable manufacturers can use these techniques just the same
as board houses. In the end, most measurements will be on microstrip
or some form of CPW, and these are the easiest to fabricate.
Delta measurement
Delta measurement refers to measurements
of two samples of different lengths, then subtracting the transmission
coefficients' phase and amplitude. This is the poor man's de-embedding,
but it is perfect for the task at hand.
Dk extraction
and filling factor
The technique we use to extract
Dk is to calculate the group delay of the delta measurement over
frequency, then assuming we know the length, it is simple algebra
to arrive at Keff. Our S-parameter
Utilities spreadsheet (available in the download
area) has a calculation of Keff in it, without the delta measurement
technique.
From Keff, we convert to Dk using
the transmission line's filling factor "FF" (further
explained on this page). We define filling factor as the percentage
of electric fields that are contained in the substrate (as opposed
to in air).
Keff is merely the weighted average
of the substrate dielectric constant (Dk) and air (where "Dk"=1):
Keff=Dk*FF+1*(1-FF)
Solving for FF:
FF=(Keff-1)/(ER-1)
Note
that if your delta measurement is contained with a TEM
media (coax or stripline) you don't need to calculate FF, as
it is unity. In coax and stripline of homogeneous media, Keff=Dk=ER.
Df extraction
In scholarly papers, there are
beaucoups equations where loss tangent is extracted from the transmission
line loss. Check
out this reference, go to page 22. The intent of the equations
is that the loss/meter (alphaT) is made up of two components, dielectric
loss and metal loss, and metal loss is known from some obtuse calculations.
The metal loss calculation assumes knowledge of metal thickness,
surface roughness and conductivity.
Assuming just two loss mechanisms:
alphaT=alphaD+alphaM
where alphaT is the total transmission
line loss that you measured, alphaD is the loss in the dielectric,
and alphaM is the loss in the metal (that you calculate).
Actually, there is a third loss
component, which is substrate conduction (call it alphaG). This
is typically zero, as most substrates are great insulators. However,
if anyone wants to apply our technique to transmission lines on
high-resistivity silicon (you MEMS
guys) just send us some data and we'll extract the substrate conductivity
for you with some updates to this analysis, we look forward to that.
And then there is radiation loss, which is not so easy to remove
from measurements, and with good design practices it can be ignored.
And in our technique so far we haven't corrected for losses due
to reflection, but we'll get around to that eventually.
In reality, you don't need to
calculate the metal loss and subtract it, because the metal loss
is staring you in the face when you plot your loss data! You only
need to know that metal loss differs from dielectric loss (due to
Df) in the data, because metal loss is proportional to square-root
of frequency, and loss factor loss is fully proportional. Our extraction
method is to merely fit a line to the data using two constants,
C1 and C2.
Loss/meter=C1*SQRT(f)+C2*(f)
Once we decide on the best fit,
the loss factor falls out of C2. If you wanted to continue the math,
you could probably use C1 to extract metal conductivity, but why
bother, when this is easily obtained elsewhere.
The units of C1 are dB/meter/GHz^.5,
and C2 and dB/meter/GHz. You could do this in Nepers and Hertz if
you are inclined, or you could use our units and shut up about them
not being "natural".
You can now obtain alphaD in
two ways. You can use the "fit alphaD" (from constant
C2 and frequency), or you can use the measured alphaT and subtract
the fit alphaM. We prefer the latter method, later we'll show you
why in the example.
Once you have alphaD and Keff,
you can calculate Df over frequency:
Df=(2*alphaD*c)/omega*SQRT(Keff))
Where c is the velocity of light
in vacuum, and alphaD is in Nepers/meter. If you are like us an
prefer alphaD in dB/meter, just divide by 8.686.
Example 1
There's nothing like a measured
example to show you how the extractions work!
Two transmission lines were measured
on R2125, which is Panasonic's version of FR-4. According to
Panasonic's datasheet, ER is 4.6 at MHz frequencies, 4.4 at
1 GHz and Df is 0.006 and 0.010 at these points.
Here are two measurements of
sample transmission lines on this material. These were microstrip
lines measuring five mils wide, two mils thick on a substrate of
height 2.7 mils. Using ADS Linecalc, this works out to an impedance
of 44.9 ohms. Not a perfect 50 ohm sample, but it will serve us
well as an example.
Here are the plotted S-parameter
magnitudes. The short sample is one inch (plus connectors), the
long sample is three inches plus connectors.


First, we calculated group delay
of the samples. We did this two ways, with the raw data, and by
adding 11-point smoothing.

From subtracting the two measurements
we arrive at the group delay of the delta measurement. This is the
smoothed data. Note there is still a mess of noise in it, which
is going to cloud our ability to extract Dk accurately.

From this we can calculate Keff.
Then by providing a filling factor of 59.7% (we cheated and calculated
FF using Agilient's ADS, more on this topic on our new filling
factor page), the Dk can be extracted. The assumption we are
relying on is that filling factor does not change much with the
dielectric constant for a given microstrip geometry.
You can be the judge as to how
well Dk is a known quantity! Let's just say it is approximately
4.3 at MHz frequencies, and somewhere around 3.8 at 9 GHz. This
is slightly off from the manufacturer's supplied data (supposed
to be 4.6 at MHz frequencies) but they don't tell you what the tolerance
is. If it was really important to know the exact DK, we'd go back
and make sure that the data is as good as possible, starting with
exact measurements of the line lengths and the repeatability of
the connectors used. Make sure your samples provide good return
loss (-15 dB or better).

Now it's time to extract the
loss tangent. First we fit our model. In this case, C1 and C2 both
worked out to -4. If you download our spreadsheet, you can fit to
your own liking, and you will no doubt come up with slightly different
numbers. Now you are getting the picture, Df measurements are in
the eye of the beholder! Anyhow, we tried to fit the data closer
at the lower frequencies, as the accuracy seems to crap out at higher
end of the measurement.

From the loss model we can extract
the loss tangent in two ways. Method 1 uses the modeled alphaD (which
is constant versus frequency), method 2 uses the measured alphaT
minus the modeled alphaM. Got that? Here the data suggest that DF
is 0.027 at X-band, which is much worse that the advertised value
of 0.01. As the mason said to his assistant who was bitching about
having to carry concrete blocks through the mud, "what did
you expect, carpeting?" In this case, what do you expect for
an ultra-cheap board material?

In conclusion, we have shown
one method of extracting Dk and Df from simple transmission line
measurements. If you have a vector network analyzer, you can do
this. The accuracy of the extraction depends heavily on the quality
of data that is used. You must be meticulous, or the answer might
be ridiculous! There's an inspirational
message if there ever was one.
Later, we'll add the filling
factor calculation, so that you won't need $100,000 worth of software
to get the value.
Now let's take a moment to check
the analysis against an ADS model... coming soon!
As always, your comments are
appreciated!
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